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DRAFT: A Scanning Test Methodology for Dynamic and Partially Reconfigurable FPGAs

dc.contributor.authorGericota, Manuel G.
dc.contributor.authorAlves, Gustavo R.
dc.contributor.authorSilva, Miguel L.
dc.contributor.authorFerreira, J. M. Martins
dc.date.accessioned2017-03-28T14:18:05Z
dc.date.available2017-03-28T14:18:05Z
dc.date.issued2001-05
dc.description.abstractA new class of FPGAs that enable partial and dynamic reconfiguration without disturbing system operation, raised a new test challenge: how to assure a continuously fault free operation, independently of the circuit present after many reconfiguration processes. A new on-line test method for those FPGAs is proposed, based on a scanning methodology and in the reuse of the IEEE 1149.1 Boundary Scan test infrastructure, already widely employed for In-System Programming.pt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.urihttp://hdl.handle.net/10400.22/9716
dc.language.isoengpt_PT
dc.relationPOCTI/33842/ESE/2000pt_PT
dc.relation.ispartofseriesETW'01;
dc.subjectFPGAspt_PT
dc.titleDRAFT: A Scanning Test Methodology for Dynamic and Partially Reconfigurable FPGAspt_PT
dc.typejournal article
dspace.entity.typePublication
oaire.citation.conferencePlaceEstocolmo, Suéciapt_PT
oaire.citation.title6th European Test Workshop (ETW'01)pt_PT
person.familyNameGericota
person.familyNameAlves
person.givenNameManuel
person.givenNameGustavo
person.identifier150015
person.identifier.ciencia-idCE13-92FF-2097
person.identifier.ciencia-id4210-4DF2-5206
person.identifier.orcid0000-0001-9774-816X
person.identifier.orcid0000-0002-1244-8502
person.identifier.ridI-7876-2014
person.identifier.scopus-author-id7006053908
rcaap.rightsopenAccesspt_PT
rcaap.typearticlept_PT
relation.isAuthorOfPublicationc84c77d9-ad89-48d1-9901-de8d5f7300b5
relation.isAuthorOfPublication01800568-7eaf-41d9-b78d-cf64f7c7381d
relation.isAuthorOfPublication.latestForDiscovery01800568-7eaf-41d9-b78d-cf64f7c7381d

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