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Advisor(s)
Abstract(s)
A new class of FPGAs that enable partial and dynamic
reconfiguration without disturbing system operation,
raised a new test challenge: how to assure a continuously
fault free operation, independently of the circuit present
after many reconfiguration processes.
A new on-line test method for those FPGAs is proposed,
based on a scanning methodology and in the reuse of the
IEEE 1149.1 Boundary Scan test infrastructure, already
widely employed for In-System Programming.
Description
Keywords
FPGAs