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DRAFT: A Scanning Test Methodology for Dynamic and Partially Reconfigurable FPGAs

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ART_GustavoAlves_DEE_3_2001.pdf182.43 KBAdobe PDF Ver/Abrir

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A new class of FPGAs that enable partial and dynamic reconfiguration without disturbing system operation, raised a new test challenge: how to assure a continuously fault free operation, independently of the circuit present after many reconfiguration processes. A new on-line test method for those FPGAs is proposed, based on a scanning methodology and in the reuse of the IEEE 1149.1 Boundary Scan test infrastructure, already widely employed for In-System Programming.

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FPGAs

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Licença CC