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Growth and Raman scattering characterization of Cu2ZnSnS4 thin films

dc.contributor.authorFernandes, P. A.
dc.contributor.authorSalomé, P. M. P.
dc.contributor.authorCunha, A. F. da
dc.date.accessioned2014-01-21T15:53:02Z
dc.date.available2014-01-21T15:53:02Z
dc.date.issued2009
dc.description.abstractIn the present work we report the results of the growth, morphological and structural characterization of Cu2ZnSnS4 (CZTS) thin films prepared by sulfurization of DC magnetron sputtered Cu/Zn/Sn precursor layers. The adjustment of the thicknesses and the properties of the precursors were used to control the final composition of the films. Its properties were studied by SEM/EDS, XRD and Raman scattering. The influence of the sulfurization temperature on the morphology, composition and structure of the films has been studied. With the presented method we have been able to prepare CZTS thin films with the kesterite structure.por
dc.identifier.doi10.1016/j.tsf.2008.11.031pt_PT
dc.identifier.issn0040-6090
dc.identifier.urihttp://hdl.handle.net/10400.22/3406
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherElsevierpor
dc.relation.ispartofseriesThin Solid Films; Vol. 517, Issue 7
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0040609008014132por
dc.subjectCu2ZnSnS4por
dc.subjectCZTSpor
dc.subjectSputteringpor
dc.subjectSulfurizationpor
dc.subjectThin filmpor
dc.subjectSolar cellpor
dc.subjectRaman scatteringpor
dc.titleGrowth and Raman scattering characterization of Cu2ZnSnS4 thin filmspor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage2523por
oaire.citation.issueIssue 7
oaire.citation.startPage2519por
oaire.citation.titleThin Solid Filmspor
oaire.citation.volumeVol. 517por
rcaap.rightsopenAccesspor
rcaap.typearticlepor

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