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Advisor(s)
Abstract(s)
In the present work we report the results of the growth, morphological and structural characterization of
Cu2ZnSnS4 (CZTS) thin films prepared by sulfurization of DC magnetron sputtered Cu/Zn/Sn precursor
layers. The adjustment of the thicknesses and the properties of the precursors were used to control the final
composition of the films. Its properties were studied by SEM/EDS, XRD and Raman scattering. The influence
of the sulfurization temperature on the morphology, composition and structure of the films has been
studied. With the presented method we have been able to prepare CZTS thin films with the kesterite
structure.
Description
Keywords
Cu2ZnSnS4 CZTS Sputtering Sulfurization Thin film Solar cell Raman scattering