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Debug and Test of Microcontroller Based Applications Using the Boundary Scan Test Infrastructure
| Nome: | Descrição: | Tamanho: | Formato: | |
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| 169 KB | Adobe PDF |
Orientador(es)
Resumo(s)
Microcontroller based applications are usually
debugged with the assistance of In-circuit emulators and logic
analysers. However, these traditional debug tools represent a
huge investment for use in classes with several groups of
students working at the same time. The development of a new
low-cost debug tool that uses the Boundary Scan Test
infrastructure to implement the basic functionality provided
by an In-circuit emulator and a logic analyser is a possible
solution to overcome this economical problem. To reduce
costs the Boundary Scan Test infrastructure is controlled
through the parallel port of a normal Personal Computer,
now widely available in classrooms.
Descrição
Palavras-chave
Boundary Scan Test Microcontrollers