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Abstract(s)
Boundary Scan Test is now widely accepted and used for
the structural test of Printed Circuit Boards. However, the
more demanding requirements of prototype debug and
validation are not sufficiently covered by the mandatory
and optional operating modes described in the IEEE
1149.1 Standard. Previous work has focused on this
problem, having resulted in a new set of user-defined
optional instructions addressing the use of the BS register
to store in real-time a sequence of contiguous vectors,
captured at its parallel inputs without / until / after a
certain condition is found. In this paper we describe the
tradeoff between input channels and storage capacity, by
proposing a new operating mode where the BS register is
used to capture / store an n-bit sequence captured at one
single functional pin. We also describe how this operating
mode can be further extended into the P1149.4 domain, for
capturing / storing the n-bit data stream generated by a SD
converter placed in the TBIC.
Description
Keywords
Boundary Scan Test