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Dynamically Rotate And Free for Test: The Path for FPGA Concurrent Test
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Orientador(es)
Resumo(s)
Dynamically reconfigurable systems have benefited
from a new class of FPGAs, recently introduced into the
market, that enables partial and dynamic reconfiguration.
While enabling concurrent reconfiguration without
disturbing system operation, this technology also raises a
new test challenge: to assure a continuously fault free
operation independently of the circuit present after the
reconfiguration process. A new structural concurrent test
method, recently proposed by the authors and based in
the principle of replicating and freeing the resources to
be tested, raised several questions, one of them being:
What strategy to follow in the process of dynamically
replicate and free those resources?
This paper presents a strategy on how to free the
resources to be tested and the results of a series of
simulation experiments made with the objective of finding
the best methodology to achieve it.
Descrição
Palavras-chave
FPGAs