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Assessment of the potential of tin sulphide thin films prepared by sulphurization of metallic precursors as cell absorbers

dc.contributor.authorMalaquias, J.
dc.contributor.authorFernandes, P. A.
dc.contributor.authorSalomé, P. M. P.
dc.contributor.authorCunha, A. F. da
dc.date.accessioned2014-01-22T11:17:13Z
dc.date.available2014-01-22T11:17:13Z
dc.date.issued2011
dc.description.abstractIn this work, SnxSy thin films have been grown on soda-lime glass substrates by sulphurization of metallic precursors in a nitrogen plus sulphur vapour atmosphere. Different sulphurization temperatures were tested, ranging from 300 °C to 520 °C. The resulting phases were structurally investigated by X-Ray Diffraction and Raman spectroscopy. Composition was studied using Energy Dispersive Spectroscopy being then correlated with the sulphurization temperature. Optical measurements were performed to obtain transmittance and reflectance spectra, from which the energy band gaps, were estimated. The values obtained were 1.17 eV for the indirect transition and for the direct transition the values varied from 1.26 eV to 1.57 eV. Electrical characterization using Hot Point Probe showed that all samples were p-type semiconductors. Solar cells were built using the structure: SLG/Mo/SnxSy/CdS/ZnO:Ga and the best result for solar cell efficiency was 0.17%.por
dc.identifier.doi10.1016/j.tsf.2011.01.393pt_PT
dc.identifier.issn0040-6090
dc.identifier.urihttp://hdl.handle.net/10400.22/3423
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherElsevierpor
dc.relation.ispartofseriesThin Solid Films; Vol. 519, Issue 21
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0040609011004615por
dc.subjectTin sulphidepor
dc.subjectSulphurizationpor
dc.subjectThin filmpor
dc.subjectSolar cellpor
dc.titleAssessment of the potential of tin sulphide thin films prepared by sulphurization of metallic precursors as cell absorberspor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage7420por
oaire.citation.issueIssue 21por
oaire.citation.startPage7416por
oaire.citation.titleThin Solid Filmspor
oaire.citation.volumeVol. 519por
rcaap.rightsopenAccesspor
rcaap.typearticlepor

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