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Classification of Experimental Errors Done in VISIR with Simple Alternated Current Circuits

2020-04-27Conference object Restricted access
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dc.contributor.authorMendonca, Lucas Nascimento
dc.contributor.authorMacaneiro, Mayara
dc.contributor.authorAlves, Gustavo R.
dc.contributor.authorPires, Danubia Soares
dc.contributor.authorGarcia-Zumbia, Javier
dc.contributor.authorCuadros, Jordi
dc.contributor.authorSerrano, Vanessa
dc.date.accessioned2021-04-22T08:39:33Z
dc.date.embargo2100
dc.date.issued2020-04-27
dc.description.abstractDuring experiments with electric circuits, students often make mistakes. To handle these situations, remote laboratories such as VISIR (Virtual Instruments Systems in Reality) rely on error-handling mechanisms, which do not always cover all errors. This article seeks to extend a previously published work when trying to assimilate all possible errors in alternated current circuits with a single power supply and a single passive component. The goal is to build an errors’ map with all possible errors, covering all circuits that can be assembled in VISIR, from the simplest to the most complex. This allows limiting misconceptions during theoretical and practical understanding are limited.pt_PT
dc.description.sponsorshipThe authors would like to acknowledge the support of the VISIR Community as well as the financial support provided by the Foundation for Science and Technology (FCT, Portugal) through grant UID/EQU/00305/2013 - Center for Innovation in Engineering and Industrial Technology – CIETI.pt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.doi10.1109/EDUCON45650.2020.9125340pt_PT
dc.identifier.urihttp://hdl.handle.net/10400.22/17862
dc.language.isoengpt_PT
dc.peerreviewedyespt_PT
dc.publisherIEEEpt_PT
dc.relationUID/EQU/00305/2013pt_PT
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/9125340pt_PT
dc.subjectVISIRpt_PT
dc.subjectElectric circuitspt_PT
dc.subjectRemote laboratorypt_PT
dc.subjectErrorspt_PT
dc.subjectExperimentspt_PT
dc.titleClassification of Experimental Errors Done in VISIR with Simple Alternated Current Circuitspt_PT
dc.typeconference object
dspace.entity.typePublication
oaire.citation.conferencePlacePortopt_PT
oaire.citation.endPage1572pt_PT
oaire.citation.startPage1568pt_PT
oaire.citation.title11th Global Engieering Education Conference (EDUCON),pt_PT
person.familyNameAlves
person.givenNameGustavo
person.identifier150015
person.identifier.ciencia-id4210-4DF2-5206
person.identifier.orcid0000-0002-1244-8502
person.identifier.ridI-7876-2014
person.identifier.scopus-author-id7006053908
rcaap.rightsclosedAccesspt_PT
rcaap.typeconferenceObjectpt_PT
relation.isAuthorOfPublication01800568-7eaf-41d9-b78d-cf64f7c7381d
relation.isAuthorOfPublication.latestForDiscovery01800568-7eaf-41d9-b78d-cf64f7c7381d

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