Browsing by Author "Seban, Mickael Maurice Lima"
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- Automated fault localization in C#Publication . Seban, Mickael Maurice Lima; Sampaio, Alberto António ChalupaDebugging is one of the most challenging processes in software development. As the complexity of software increases, traditional debugging methods are becoming less viable and more expensive. Over the years, techniques for automatically locating defects, as well as improving them, and tools that implement these techniques have been developed. Although there have been significant improvements, the freely available tools still fall short when it comes to supporting C# projects. This dissertation proposes the design and implementation of an automatic defect location tool for C# projects. The tool, developed during this dissertation, is called FaultDetector. NET. It contains two versions: one that integrates into Integrated Development Environment (IDE) Visual Studio 2022, and another that is a Command Line Interface (CLI) to support CI/CD pipelines. Some new defect localization techniques will be explored to bridge the gap between academic research and practical applications in software development. A case study is carried out using the Defects Sample Project, a collection of C# projects containing reproducible bugs representative of different real-world software domains. Suspicion ratings and fault identification efficiency are used as metrics to compare the various fault localization techniques supported by the tool. This work focuses mainly on the importance of seamlessly integrating automatic fault localization into the development environments widely used by C# software engineers.