Percorrer por autor "Alves, Cristiana F. Almeida"
A mostrar 1 - 1 de 1
Resultados por página
Opções de ordenação
- Zirconium aluminum nitride thin films for temperature sensing applicationsPublication . Fernandes, Filipe; Martins, Bruno; Patacas, Carlos; Cavaleiro, Albano; Faia, Pedro; Alves, Cristiana F. Almeida; Carbo-Argibay, Enrique; Ferreira, Paulo J.This study explores the development and characterization of zirconium aluminum nitride (ZrAlN) thin films produced via magnetron sputtering for temperature sensing applications. The sensor film is integrated into a fully nitride multilayer coating and designed to work in harsh environments. The ZrAlN demonstrated stable semiconductor behavior up to 750 °C, making it suitable for high-temperature thermistors, with a β value of approximately 850 K after signal stabilization. Detailed structural characterization confirmed a mixed-phase structure of poorly crystalline cubic ZrN and orthorhombic Zr3N4. This structure is believed to be responsible for the high resistivity of 8.0 × 105 µΩ·cm observed in Zr1-xAlxN with x = 0.3. The examination of Zr0.7Al0.3N integrated into the multilayer coating revealed a columnar morphology with diffuse nanolayers, alternating between aluminum-rich and aluminum-poor zones, caused by the two-fold rotational deposition. The sensor coating was further tested on a cutting tool substrate, with the Zr0.7Al0.3N layer exhibiting a sensitivity of 800 K and demonstrating effective temperature measurements up to 400 °C. The Zr0.7Al0.3N layer inserted in a nitride-based multilayer coating, combined with Arduino® for signal acquisition, resulted in a measured error of approximately 7 %. The setup presented the potential for integration into manufacturing environments aligned with Industry 4.0.