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Advisor(s)
Abstract(s)
Matching the results obtained from circuit simulation with those extracted from circuit functioning is a common stage of the final verification process. Many current verification techniques use the I/O vectors produced during functional and / or timing simulation, for creating the test vectors to be applied / compared against the circuit responses. Techniques that are more complete include extracting the values of internal sequential nodes and comparing these using internal scans. This paper describes such a solution for verifying digital designs implemented in currently commercial available CPLDs. The test program is automatically generated from information that encompasses the design & development phase, namely: the file containing the results from simulation, the BSDL file, an internal scan chain description file, and one file containing the user options.
Description
Keywords
Design for debug and test 1149.1