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A framework for self-healing radiation-tolerant implementations on reconfigurable FPGAs

dc.contributor.authorGericota, Manuel G.
dc.contributor.authorLemos, L. F.
dc.contributor.authorAlves, Gustavo R.
dc.contributor.authorFerreira, José M.
dc.date.accessioned2014-07-03T10:15:13Z
dc.date.available2014-07-03T10:15:13Z
dc.date.issued2007
dc.description.abstractTo increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scales are highly vulnerable to radiation-induced faults that affect values stored in memory cells. Since the functional definition of FPGAs relies on memory cells, they become highly prone to this type of faults. Fault tolerant implementations, based on triple modular redundancy (TMR) infrastructures, help to keep the correct operation of the circuit. However, TMR is not sufficient to guarantee the safe operation of a circuit. Other issues like the effects of multi-bit upsets (MBU) or fault accumulation, have also to be addressed. Furthermore, in case of a fault occurrence the correct operation of the affected module must be restored and the current state of the circuit coherently re-established. A solution that enables the autonomous correct restoration of the functional definition of the affected module, avoiding fault accumulation, re-establishing the correct circuit state in realtime, while keeping the normal operation of the circuit, is presented in this paper.por
dc.identifier.doi10.1109/DDECS.2007.4295300
dc.identifier.isbn1-4244-1162-9
dc.identifier.urihttp://hdl.handle.net/10400.22/4650
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherIEEEpor
dc.relation.ispartofseriesDesign and Diagnostics of Electronic Circuits and Systems;
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4295300por
dc.titleA framework for self-healing radiation-tolerant implementations on reconfigurable FPGAspor
dc.typeconference object
dspace.entity.typePublication
oaire.citation.conferencePlaceKrakowpor
oaire.citation.endPage6por
oaire.citation.startPage1por
oaire.citation.titleIEEE Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07por
person.familyNameGericota
person.familyNameAlves
person.givenNameManuel
person.givenNameGustavo
person.identifier150015
person.identifier.ciencia-idCE13-92FF-2097
person.identifier.ciencia-id4210-4DF2-5206
person.identifier.orcid0000-0001-9774-816X
person.identifier.orcid0000-0002-1244-8502
person.identifier.ridI-7876-2014
person.identifier.scopus-author-id7006053908
rcaap.rightsclosedAccesspor
rcaap.typeconferenceObjectpor
relation.isAuthorOfPublicationc84c77d9-ad89-48d1-9901-de8d5f7300b5
relation.isAuthorOfPublication01800568-7eaf-41d9-b78d-cf64f7c7381d
relation.isAuthorOfPublication.latestForDiscoveryc84c77d9-ad89-48d1-9901-de8d5f7300b5

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