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From design-for-test to design-for-debug-and-test: analysis of requirements and limitations for 1149.1

dc.contributor.authorAlves, Gustavo R.
dc.contributor.authorFerreira, José M.
dc.date.accessioned2014-05-22T10:59:51Z
dc.date.available2014-05-22T10:59:51Z
dc.date.issued1999
dc.description.abstractThe increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mounting technologies restrict the usefulness of conventional in-circuit debugging tools, such as in-circuit emulators for microprocessors and microcontrollers. However, this same trend enables the development of more complex products, which in turn require more powerful debugging tools. These conflicting demands could be met if the standard scan test infrastructures now common in most complex components were able to match the debugging requirements of design verification and prototype validation. This paper analyses the main debug requirements in the design of microprocessor-based applications and the feasibility of their implementation using the mandatory, optional and additional operating modes of the standard IEEE 1149.1 test infrastructure.por
dc.identifier.doi10.1109/VTEST.1999.766706
dc.identifier.isbn0-7695-0146-X
dc.identifier.urihttp://hdl.handle.net/10400.22/4365
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherIEEEpor
dc.relation.ispartofseriesVLSI Test Symposium;
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=766706por
dc.titleFrom design-for-test to design-for-debug-and-test: analysis of requirements and limitations for 1149.1por
dc.typeconference object
dspace.entity.typePublication
oaire.citation.conferencePlaceDana Point, CApor
oaire.citation.startPage473por
oaire.citation.title17TH IEEE VLSI Test Symposiumpor
person.familyNameAlves
person.givenNameGustavo
person.identifier150015
person.identifier.ciencia-id4210-4DF2-5206
person.identifier.orcid0000-0002-1244-8502
person.identifier.ridI-7876-2014
person.identifier.scopus-author-id7006053908
rcaap.rightsclosedAccesspor
rcaap.typeconferenceObjectpor
relation.isAuthorOfPublication01800568-7eaf-41d9-b78d-cf64f7c7381d
relation.isAuthorOfPublication.latestForDiscovery01800568-7eaf-41d9-b78d-cf64f7c7381d

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