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An HDL Approach to Board-Level BIST

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Autores

Alves, Gustavo R.
Gericota, Manuel G.

Orientador(es)

Resumo(s)

Boundary scan is now the most promising technology for testing high-complexity printed circuit boards. The number of BST components available to board-level designers is however still restricted, limiting the achievable fault coverage. The requirements to improve board-level testability are analysed, and a corresponding set of testability building blocks are proposed. A low-cost and maximum-flexibility solution is described, which implements these blocks on medium-complexity PLDs, using a simple and powerful HDL.

Descrição

Palavras-chave

Design for testability Boundary scan

Contexto Educativo

Citação

Projetos de investigação

Unidades organizacionais

Fascículo

Editora

Institute of Electrical and Electronics Engineers

Licença CC

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