Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.22/4365
Título: From design-for-test to design-for-debug-and-test: analysis of requirements and limitations for 1149.1
Autor: Alves, Gustavo R.
Ferreira, José M.
Data: 1999
Editora: IEEE
Relatório da Série N.º: VLSI Test Symposium;
Resumo: The increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mounting technologies restrict the usefulness of conventional in-circuit debugging tools, such as in-circuit emulators for microprocessors and microcontrollers. However, this same trend enables the development of more complex products, which in turn require more powerful debugging tools. These conflicting demands could be met if the standard scan test infrastructures now common in most complex components were able to match the debugging requirements of design verification and prototype validation. This paper analyses the main debug requirements in the design of microprocessor-based applications and the feasibility of their implementation using the mandatory, optional and additional operating modes of the standard IEEE 1149.1 test infrastructure.
Peer review: yes
URI: http://hdl.handle.net/10400.22/4365
ISBN: 0-7695-0146-X
Versão do Editor: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=766706
Aparece nas colecções:ISEP – CIETI – Comunicações em eventos científicos
ISEP – DEE – Comunicações em eventos científicos

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