Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.22/4253
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dc.contributor.authorFidalgo, André Vaz-
dc.contributor.authorAlves, Gustavo R.-
dc.contributor.authorFelgueiras, Manuel C.-
dc.contributor.authorGericota, Manuel G.-
dc.date.accessioned2014-03-27T10:50:49Z-
dc.date.available2014-03-27T10:50:49Z-
dc.date.issued2009-
dc.identifierDOI 10.1109/IOLTS.2009.5196006-
dc.identifier.isbn978-1-4244-4596-7-
dc.identifier.isbn978-1-4244-4595-0-
dc.identifier.urihttp://hdl.handle.net/10400.22/4253-
dc.description.abstractThis paper proposes an online mechanism that can evaluate the sensitivity of single event upsets (SEUs) of field programmable gate arrays (FPGAs). The online detection mechanism cyclically reads and compares the values form the external and internal configuration memories, taking into account the mask information. This remote detection method also signals any mismatch as a result of a SEU that affects both used and not-used FPGA parts, which maximizes the monitored area. By utilizing an external, Web-accessible controller that is connected to the test infrastructure, the possibility of running the same operation in a remote manner is enabled. Moreover, the need for a local memory to store the mask values is also eliminated.por
dc.language.isoengpor
dc.publisherIEEEpor
dc.relation.ispartofseriesOn-Line Testing Symposium;-
dc.rightsopenAccesspor
dc.titleUsing test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAspor
dc.typeconferenceObjectpor
dc.peerreviewedyespor
degois.publication.firstPage181por
degois.publication.locationSesimbra, Lisbonpor
degois.publication.titleIOLTS 2009. 15th IEEE International On-Line Testing Symposiumpor
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5196006por
Aparece nas colecções:ISEP – CIETI – Comunicações em eventos científicos
ISEP – DEE – Comunicações em eventos científicos

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