Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.22/3745
Título: JamLab: augmenting sensornet testbeds with realistic and controlled interference generation
Autor: Boano, Carlo Alberto
Voigt, Thiemo
Noda, Claro
Römer, Kay
Zúñiga, Marco
Palavras-chave: JamLab
Interference generation
Wireless sensor networks
Augmenting sensornet testbeds
Data: 2011
Editora: IEEE
Relatório da Série N.º: Information Processing in Sensor Networks (IPSN);
Resumo: Radio interference drastically affects the performance of sensor-net communications, leading to packet loss and reduced energy-efficiency. As an increasing number of wireless devices operates on the same ISM frequencies, there is a strong need for understanding and debugging the performance of existing sensornet protocols under interference. Doing so requires a low-cost flexible testbed infrastructure that allows the repeatable generation of a wide range of interference patterns. Unfortunately, to date, existing sensornet testbeds lack such capabilities, and do not permit to study easily the coexistence problems between devices sharing the same frequencies. This paper addresses the current lack of such an infrastructure by using off-the-shelf sensor motes to record and playback interference patterns as well as to generate customizable and repeat-able interference in real-time. We propose and develop JamLab: a low-cost infrastructure to augment existing sensornet testbeds with accurate interference generation while limiting the overhead to a simple upload of the appropriate software. We explain how we tackle the hardware limitations and get an accurate measurement and regeneration of interference, and we experimentally evaluate the accuracy of JamLab with respect to time, space, and intensity. We further use JamLab to characterize the impact of interference on sensornet MAC protocols.
Peer review: yes
URI: http://hdl.handle.net/10400.22/3745
ISBN: 978-1-4503-0512-9
Versão do Editor: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5779101&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5779101
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