Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.22/3406
Título: Growth and Raman scattering characterization of Cu2ZnSnS4 thin films
Autor: Fernandes, P. A.
Salomé, P. M. P.
Cunha, A. F. da
Palavras-chave: Cu2ZnSnS4
CZTS
Sputtering
Sulfurization
Thin film
Solar cell
Raman scattering
Data: 2009
Editora: Elsevier
Relatório da Série N.º: Thin Solid Films; Vol. 517, Issue 7
Resumo: In the present work we report the results of the growth, morphological and structural characterization of Cu2ZnSnS4 (CZTS) thin films prepared by sulfurization of DC magnetron sputtered Cu/Zn/Sn precursor layers. The adjustment of the thicknesses and the properties of the precursors were used to control the final composition of the films. Its properties were studied by SEM/EDS, XRD and Raman scattering. The influence of the sulfurization temperature on the morphology, composition and structure of the films has been studied. With the presented method we have been able to prepare CZTS thin films with the kesterite structure.
Peer review: yes
URI: http://hdl.handle.net/10400.22/3406
ISSN: 0040-6090
Versão do Editor: http://www.sciencedirect.com/science/article/pii/S0040609008014132
Aparece nas colecções:ISEP – DFI – Artigos

Ficheiros deste registo:
Ficheiro Descrição TamanhoFormato 
ART_PauloFernandes_2009_DFI.pdf917,79 kBAdobe PDFVer/Abrir


FacebookTwitterDeliciousLinkedInDiggGoogle BookmarksMySpace
Formato BibTex MendeleyEndnote Degois 

Todos os registos no repositório estão protegidos por leis de copyright, com todos os direitos reservados.